Total Dose Dependence of SEE Sensitivities for Microprocessor 80C86 and Its Peripheral Chip 82C85
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Graphical Abstract
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Abstract
Total dose dependence of the single event effct (SEE) sensitivity for microprocessor 80C86 and its peripheral chip 82C85 are reported. In this study, 1 μCi 252 Cf was used as a heavy ion simulator and the samples were tested by a patent 8086 test system following exposure to 60 Co γ rays. It is found that SEE cross section of 80C86 does not show significant change with increasing total dose from 0-120 Gy(Si). SEE test also shows that single event transient (SET) in 82C85...
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