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基于储存环反应显微成像谱仪开展的高能Fe26+-He碰撞中单、双电离截面比研究

Study on the Cross-Section Ratio of Single to Double Ionization in High-Energy Fe26+-He Collisions Based on a Storage Ring Reaction Microscope

  • 摘要: 基于兰州重离子加速器实验环(HIRFL-CSRe)新建成的高能反应显微成像谱仪装置,开展了25 MeV/u、120 MeV/u能量下\rmFe^26+与He原子靶碰撞电离实验。通过提取反冲离子飞行时间谱,获得了在这两个能量点下He靶的单、双电离截面比。实验结果表明:在所选择的微扰强度( \eta=Z_\rmp^ /v_\rmp^ =0.41,\ 0.84 )下,He靶单、双电离过程的截面比不仅受炮弹速度的影响,炮弹的电荷态对于靶电离机制的贡献也同样重要。通过与已发表的实验结果对比,发现考虑库仑长程势后Knudsen等人的经验公式在低电荷态和高电荷态碰撞过程中都具有很好的适用性。

     

    Abstract: Using the newly established high-energy reaction microscope imaging spectrometer at the Heavy Ion Research Facility in Lanzhou (HIRFL-CSRe), we conducted ionization experiments involving \rmFe^26+ colliding with a helium atom target at energies of 25 and 120 MeV/u. By extracting the time-of-flight spectra of recoil ions, we obtained the single and double ionization cross-section ratios of the helium target at these two energy points. The experimental results indicate that, under the selected perturbation strengths ( \eta=Z_\rmp^ /v_\rmp^ =0.41,\ 0.84 ), the cross-section ratios for single and double ionization processes of the helium target are influenced not only by the projectile velocity but also by the charge state of the projectile, which plays a crucial role in the target ionization mechanism. A comparison with previously published experimental results revealed that, after considering the long-range Coulomb potential, the empirical formula by Knudsen et al. exhibits excellent applicability in both low and high charge state collision processes.

     

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