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面向多维度测量的硅像素探测器读出芯片IMPix-N1的设计

Design of IMPix-N1, a Silicon Pixel Detector Readout Chip for Multi-dimensional Measurements

  • 摘要: 为满足高能物理实验对基本粒子检测和分析的需求,现代硅像素探测器研发日益趋向追求低功耗、高分辨率、高读出效率的性能目标。本工作研究了一款名为IMPix-N1的硅像素探测器数模混合读出芯片。该芯片的像素阵列由16行×16列像素单元构成,每个像素单元面积为100 μm×100 μm。每1行×8列的像素单元组成一个超级像素,其内部具有共同的逻辑电路进行控制。芯片具有像素配置模式和三种像素数据读出模式,实现了对击中粒子时间、能量及位置信息的测量、存储及读出。时间数字转换电路(TDC)可以同时测量和记录粒子的到达时间(TOA)和过阈时间(TOT),时间测量精度可达到5 ns。IMPix-N1适用于高时间分辨、高空间分辨以及快速数据获取需求的粒子探测实验。本芯片基于TSMC 180 nm工艺,整体使用digital-on-top的设计方法实现。我们对像素单元数字电路、超级像素控制电路和外围数字电路进行仿真验证,前后仿真结果一致,满足设计要求。

     

    Abstract: To meet the demands of particle detection and identification in high-energy physics experiments, the development of silicon pixel detectors is increasingly oriented toward achieving the performance goals of low power consumption, high resolution, and high readout efficiency. This paper presents a silicon pixel detector readout ASIC named IMPix-N1. The pixel array comprises 16 rows × 16 columns of square pixels, with a size of 100 μm × 100 μm. Each pixel unit 1 row × 8 columns forms a super pixel, which is internally controlled by a shared logic circuit. The ASIC features a pixel configuration mode and three pixel data readout modes, enabling the measurement, storage, and readout of time, energy, and position information of incident particles. The Time-to-Digital Converter (TDC) circuit can simultaneously measure and record the Time of Arrival (TOA) and Time Over Threshold (TOT) of particles, with a timing resolution of 5 ns. The IMPix-N1 is suitable for particle detection experiments requiring high time resolution, high spatial resolution, and fast data acquisition. This ASIC is implemented based on TSMC 180 nm technology, adopting a digital-on-top design methodology throughout. We conducted simulation verifications on the digital circuit of the pixel unit, the control circuit of the super pixel, and the peripheral digital circuits. The pre- and post-layout simulation results are consistent, meeting the design requirements.

     

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