摘要: 本文介绍了低能Ｘ射线分析领域内正在迅速发展的一种新探测技术──平面晶体波长色散位置灵敏谱仪，它的基本原理、有关技术、应用及对其发展前景的展望． The paper introduces a new detection technique being quickly developed──wavelength dispersive position sensitive spectrometer with a flat crystal in the area of low energy X-ray analysis, its basic principle, related technology and applications. The development prospects and the future study are also discussed.